Facilities Resources OverviewLaser Diode Characterization Platform - LD characterization platform has been developed for testing of high power, multi-functional edge-emitting laser diodes. It is capable of temperature-dependent, DC/pulse, high-frequency, and multi-probing measurements.Laser-based Solid-State Lighting Characterization System - Study the white-light characteristics generated by laser diodes or laser diodes with various phosphor mixtures. White light characteristics include CRI, CCT, CIE 1931/1960 color space, spectrum, efficacy, etc.LED Device Packaging - Phosphor coating preparation and curing. LED encapsulation.LED Characterization Station - Electroluminescence (EL) by definition is the illumination from the material under the passage of an external voltage bias (electrical field) or injection current. This phenomenon is the result of radiative recombination in a material. In the direct bandgap semiconductor, the excess electrons and holes flow into the semiconductor, recombine and release their energy as photons without changing the crystal momentum. I-V, L-I and EL setup: Keithley 2400 source meter, Newport 2936C power meter and Ocean Optics QE65000 spectrometer.Underwater Wireless Optical Communication (UWOC) System - Laser-based underwater wireless optical communication system.MBE Veeco GEN930 Reactor - The GEN930 system gives you the maximum flexibility in materials research. Its geometry, unique cryopanel, and numerous ports for integrating today’s leading edge in situ analytical tools ensure material purity. The reliability of the system has been proven in many of the leading material research laboratories around the world. Molecular beam epitaxy (MBE) reactor for III-N material growth.
